Scanning Electron Microscope Laboratory

SEM Sample Overlay Unit Sputter Coating Leica (EM ACE600, High vacuum) Device Description High Vacuum Metal and Carbon Coating Device: It is used for coating the surface of non-conductive samples to be examined in electron microscope. Device SpecificationsMeasurements Made by …

Scanning Electron Microscopy (SEM) < /p> Scanning Electron microscope SEM(HITACHI, SU7000 Field Emission SEM) Device Description Electron microscopy is used for imaging materials in micro/nano dimensions, determining the elemental and chemical compositions of materials. Device SpecificationsMeasurements Made by DeviceDevice Specifications …