{"id":12423,"date":"2022-01-05T17:35:56","date_gmt":"2022-01-05T14:35:56","guid":{"rendered":"https:\/\/detuam.sbu.edu.tr\/cihazlar\/masaustu-taramali-elektron-mikroskobu-sem\/"},"modified":"2022-11-09T11:32:10","modified_gmt":"2022-11-09T08:32:10","slug":"desktop-scanning-electron-microscope-sem","status":"publish","type":"cihazlar","link":"https:\/\/detuam.sbu.edu.tr\/en\/cihazlar\/desktop-scanning-electron-microscope-sem\/","title":{"rendered":"Desktop Scanning Electron Microscope (SEM)"},"content":{"rendered":"

[vc_row gap=”35″][vc_column width=”1\/2″][vc_single_image image=”9176″ img_size=”full” onclick=”zoom” css_animation=”fadeInUp”][\/vc_column][vc_column width=”1\/2″]

Desktop SEM (Materials Microscope)<\/h3><\/span><\/div><\/div><\/div>[vc_column_text css_animation=”fadeInUp”]<\/p>\n

Desktop SEM
\nJEOL, JCM-7000 NeoScope\u2122, Japan<\/h4>\n

Device Description<\/strong>
\nThe Scanning Electron Microscope (SEM) is a microscope that obtains images by scanning the sample surface with a focused beam of electrons. JCM-7000 desktop SEM is an easy-to-use SEM device that can provide seamless navigation, low kV mode, and easy to use.[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_tta_tabs active_section=”1″ css_animation=”fadeInUp”][vc_tta_section title=”Device Specifications” tab_id=”tech”][vc_column_text]<\/p>\n

    \n
  • Acceleration voltage: 5 kV, 10 kV, 15 kV (3 modes)<\/li>\n
  • Max. sample size: 80 mm diameter, 50 mm height<\/li>\n
  • Direct magnification: 10x \u2013 100,000x<\/li>\n
  • High and low vacuum mode<\/li>\n
  • Electron source: tungsten filament<\/li>\n
  • Auto-focus, gun alignment, stigmator, brightness\/contrast features<\/li>\n<\/ul>\n

    [\/vc_column_text][\/vc_tta_section][vc_tta_section title=”Measurements Made by Device” tab_id=”measurement”][vc_column_text]<\/p>\n

      \n
    • Quick evaluation after micro- and nano-fiber production with the electrospin device<\/li>\n
    • Imaging of surface topography and morphology in conductive materials<\/li>\n
    • Metals, ceramics, polymers, textiles, fibers, particles (such as sand, powder materials, pollen) various samples can be studied.<\/li>\n
    • Non-conductive samples can be visualized after coating with very thin conductive materials (eg Au), making them examineable.<\/li>\n<\/ul>\n

      [\/vc_column_text][\/vc_tta_section][\/vc_tta_tabs][\/vc_column][\/vc_row][vc_row css_animation=”fadeInUp”][vc_column]

      Other Devices in Lab<\/h3><\/span><\/div><\/div>[vc_basic_grid post_type=”cihazlar” max_items=”12″ style=”pagination” items_per_page=”4″ element_width=”3″ orderby=”rand” arrows_design=”vc_arrow-icon-arrow_09_left” arrows_position=”outside” arrows_color=”black” loop=”yes” item=”9541″ grid_id=”vc_gid:1667982719518-2f57c1e6-c9fd-2″ taxonomies=”260″][\/vc_column][\/vc_row]<\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"

      [vc_row gap=”35″][vc_column width=”1\/2″][vc_single_image image=”9176″ img_size=”full” onclick=”zoom” css_animation=”fadeInUp”][\/vc_column][vc_column width=”1\/2″][vc_column_text css_animation=”fadeInUp”] Desktop SEM JEOL, JCM-7000 NeoScope\u2122, Japan Device Description The Scanning Electron Microscope (SEM) is a microscope that obtains images by scanning the sample surface with a focused beam of electrons. JCM-7000 … <\/p>\n","protected":false},"author":6,"featured_media":11741,"menu_order":39,"comment_status":"closed","ping_status":"closed","template":"","format":"standard","meta":{"_bbp_topic_count":0,"_bbp_reply_count":0,"_bbp_total_topic_count":0,"_bbp_total_reply_count":0,"_bbp_voice_count":0,"_bbp_anonymous_reply_count":0,"_bbp_topic_count_hidden":0,"_bbp_reply_count_hidden":0,"_bbp_forum_subforum_count":0,"inline_featured_image":false,"wds_primary_category":0,"wds_primary_our_team_category":0,"footnotes":""},"categories":[],"cihazlarr":[],"class_list":["post-12423","cihazlar","type-cihazlar","status-publish","format-standard","has-post-thumbnail","hentry","our_team_category-biomaterials-laboratory","our_team_category-instruments"],"_links":{"self":[{"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlar\/12423","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlar"}],"about":[{"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/types\/cihazlar"}],"author":[{"embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/users\/6"}],"replies":[{"embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/comments?post=12423"}],"version-history":[{"count":2,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlar\/12423\/revisions"}],"predecessor-version":[{"id":12786,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlar\/12423\/revisions\/12786"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/media\/11741"}],"wp:attachment":[{"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/media?parent=12423"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/categories?post=12423"},{"taxonomy":"cihazlarr","embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlarr?post=12423"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}