{"id":12469,"date":"2022-01-05T16:17:13","date_gmt":"2022-01-05T13:17:13","guid":{"rendered":"https:\/\/detuam.sbu.edu.tr\/cihazlar\/taramali-elektron-mikroskobu-sem\/"},"modified":"2026-07-02T18:19:58","modified_gmt":"2026-07-02T15:19:58","slug":"scanning-electron-microscope-sem","status":"publish","type":"cihazlar","link":"https:\/\/detuam.sbu.edu.tr\/en\/cihazlar\/scanning-electron-microscope-sem\/","title":{"rendered":"Scanning Electron Microscope (SEM)"},"content":{"rendered":"<div class=\"wpb-content-wrapper\"><p>[vc_row gap=&#8221;35&#8243;][vc_column width=&#8221;1\/2&#8243;][vc_single_image image=&#8221;11550&#8243; img_size=&#8221;full&#8221; onclick=&#8221;zoom&#8221; css_animation=&#8221;fadeInUp&#8221;][\/vc_column][vc_column width=&#8221;1\/2&#8243;]<div class=\"vc-extral_class wpb_animate_when_almost_visible wpb_fadeInUp fadeInUp\"><div class=\"thim-widget-heading template-base\"><div class=\"sc_heading  \"><h3 class=\"title\">Scanning Electron Microscope (SEM)<\/h3><span class=\"line\"><\/span><\/div><\/div><\/div>[vc_column_text css_animation=&#8221;fadeInUp&#8221; css=&#8221;&#8221;]<\/p>\n<h4>Scanning Electron Microscope (SEM)<br \/>\nSEM (HITACHI SU7000 Field Emission SEM)<\/h4>\n<p><strong>Device Description<\/strong><br \/>\nThe electron microscope is used for imaging materials at the micro\/nano scale and for determining the elemental and chemical compositions of materials.<\/p>\n<p>Assoc. Prof. Dr. Sevde ALTUNTA\u015e<\/p>\n<p>LAB 102[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_tta_tabs active_section=&#8221;1&#8243; css_animation=&#8221;fadeInUp&#8221;][vc_tta_section title=&#8221;Technical Specifications of the Device&#8221; tab_id=&#8221;tech&#8221;][vc_column_text]<\/p>\n<ul>\n<li>Acceleration voltage: 30 kV<\/li>\n<li>Point resolution: 0.8 nm (@15 kV), 0.9 nm (@1 kV)<\/li>\n<li>Sample stage tilt angle: -5~70\u00b0<\/li>\n<li>Detectors: UD (Upper Detector), MD (Middle Detector), LD (Lower Detector), UVD (Ultra Variable Pressure Detector)<\/li>\n<li>Variable Pressure (VP) mode<\/li>\n<li>EDX detector<\/li>\n<li>STEM detector<\/li>\n<\/ul>\n<p>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Measurements Performed with the Device&#8221; tab_id=&#8221;measurement&#8221;][vc_column_text]<\/p>\n<ul>\n<li>Imaging of micro\/nano structures<\/li>\n<li>Imaging of the structures of biological samples<\/li>\n<li>STEM imaging<\/li>\n<li>Point analysis of the elemental and chemical compositions of materials<\/li>\n<li>EDX mapping<\/li>\n<\/ul>\n<p>[\/vc_column_text][\/vc_tta_section][\/vc_tta_tabs][\/vc_column][\/vc_row][vc_row css_animation=&#8221;fadeInUp&#8221;][vc_column]<div class=\"thim-widget-heading template-base\"><div class=\"sc_heading  \"><h3 class=\"title\">Other Devices in the Laboratory<\/h3><span class=\"line\"><\/span><\/div><\/div>[vc_basic_grid post_type=&#8221;cihazlar&#8221; max_items=&#8221;12&#8243; style=&#8221;pagination&#8221; items_per_page=&#8221;4&#8243; element_width=&#8221;3&#8243; orderby=&#8221;rand&#8221; arrows_design=&#8221;vc_arrow-icon-arrow_09_left&#8221; arrows_position=&#8221;outside&#8221; arrows_color=&#8221;black&#8221; loop=&#8221;yes&#8221; item=&#8221;9541&#8243; grid_id=&#8221;vc_gid:1777915895822-01d52f8439fdc65d31e35141e9eef901-10&#8243; taxonomies=&#8221;235&#8243;][\/vc_column][\/vc_row]<\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"<p>[vc_row gap=&#8221;35&#8243;][vc_column width=&#8221;1\/2&#8243;][vc_single_image image=&#8221;11550&#8243; img_size=&#8221;full&#8221; onclick=&#8221;zoom&#8221; css_animation=&#8221;fadeInUp&#8221;][\/vc_column][vc_column width=&#8221;1\/2&#8243;][vc_column_text css_animation=&#8221;fadeInUp&#8221; css=&#8221;&#8221;] Scanning Electron Microscope (SEM) SEM (HITACHI SU7000 Field Emission SEM) Device Description The electron microscope is used for imaging materials at the micro\/nano scale and for determining the elemental and &hellip; <\/p>\n","protected":false},"author":6,"featured_media":11764,"menu_order":140,"comment_status":"closed","ping_status":"closed","template":"","format":"standard","meta":{"wds_primary_category":0,"wds_primary_our_team_category":0,"footnotes":""},"categories":[],"cihazlarr":[],"class_list":["post-12469","cihazlar","type-cihazlar","status-publish","format-standard","has-post-thumbnail","hentry","our_team_category-instruments","our_team_category-scanning-electron-microscope-laboratory"],"_links":{"self":[{"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlar\/12469","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlar"}],"about":[{"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/types\/cihazlar"}],"author":[{"embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/users\/6"}],"replies":[{"embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/comments?post=12469"}],"version-history":[{"count":4,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlar\/12469\/revisions"}],"predecessor-version":[{"id":13853,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlar\/12469\/revisions\/13853"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/media\/11764"}],"wp:attachment":[{"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/media?parent=12469"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/categories?post=12469"},{"taxonomy":"cihazlarr","embeddable":true,"href":"https:\/\/detuam.sbu.edu.tr\/en\/wp-json\/wp\/v2\/cihazlarr?post=12469"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}