Atomic Force Microscope (AFM)

Atomic Force Microscope

Nanosurf CoreAFM Atomic Force Microscope

Device Description

It is a compact atomic force microscope that integrates a modern flexure-guided tip scanner, XYZ sample table, camera, active vibration isolation table and airflow protection all in one unit.

  • Minimize noise with Isostage and SpikeGuard features
  • Static Force mode
  • Dynamic Force mode (Tapping mode)
  • Phase display mode
  • Maximum height range (Z-axis): 12 µm
  • Maximum scan area (X-Y axis): 100 µm
  • Surface topology analysis at micro and nano dimensions.

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