Atomic Force Microscope (AFM)
Nanosurf CoreAFM Atomic Force Microscope
Device Description
It is a compact atomic force microscope that integrates a modern flexure-guided tip scanner, XYZ sample table, camera, active vibration isolation table and airflow protection all in one unit.
- Minimize noise with Isostage and SpikeGuard features
- Static Force mode
- Dynamic Force mode (Tapping mode)
- Phase display mode
- Maximum height range (Z-axis): 12 µm
- Maximum scan area (X-Y axis): 100 µm
- Surface topology analysis at micro and nano dimensions.
