Atomic Force Microscope (AFM)
Nanosurf CoreAFM Atomic Force Microscope
Device Description
It is a compact atomic force microscope that integrates a modern flexure-guided tip scanner, XYZ sample stage, camera, active vibration isolation table, and airflow protection in an all-in-one unit.
Asst. Prof. Dr. Gamze YEŞİLAY
LAB 212
- Noise minimization with Isostage and SpikeGuard features
- Static Force mode
- Dynamic Force mode (Tapping mode)
- Phase imaging mode
- Maximum height range (Z-axis): 12 µm
- Maximum scanning area (X-Y axis): 100 µm
- Surface topology analysis at micro and nano scales.
