Desktop Scanning Electron Microscope (SEM)
Desktop SEM
JEOL, JCM-7000 NeoScope™, Japan
Device Description
The Scanning Electron Microscope (SEM) is a microscope that obtains images by scanning the sample surface with a focused beam of electrons. JCM-7000 desktop SEM is an easy-to-use SEM device that can provide seamless navigation, low kV mode, and easy to use.
- Acceleration voltage: 5 kV, 10 kV, 15 kV (3 modes)
- Max. sample size: 80 mm diameter, 50 mm height
- Direct magnification: 10x – 100,000x
- High and low vacuum mode
- Electron source: tungsten filament
- Auto-focus, gun alignment, stigmator, brightness/contrast features
- Quick evaluation after micro- and nano-fiber production with the electrospin device
- Imaging of surface topography and morphology in conductive materials
- Metals, ceramics, polymers, textiles, fibers, particles (such as sand, powder materials, pollen) various samples can be studied.
- Non-conductive samples can be visualized after coating with very thin conductive materials (eg Au), making them examineable.
