Desktop Scanning Electron Microscope (SEM)
Desktop SEM
JEOL, JCM-7000 NeoScope™, Japan
Device Description
A Scanning Electron Microscope (SEM) is a microscope that obtains images by scanning the sample surface with a focused electron beam. The JCM-7000 desktop SEM is an easy-to-use SEM device that provides seamless navigation and features a low-kV mode.
Prof. Dr. Erkan Türker BARAN
LAB 105
- Accelerating voltage: 5 kV, 10 kV, 15 kV (3 modes)
- Max. sample size: 80 mm diameter, 50 mm height
- Direct magnification: 10x – 100,000x
- High and low vacuum modes
- Electron source: tungsten filament
- Auto-focus, gun alignment, stigmator, brightness/contrast features
- Rapid evaluation after micro- and nanofiber production with the electrospinning device
- Imaging of surface topography and morphology in conductive materials
- Various samples such as metals, ceramics, polymers, textile products, fibers, and particles such as sand, powder materials, and pollen can be studied.
- Non-conductive samples can be imaged after being made suitable for examination by coating them with very thin conductive materials, such as Au.
