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Critical Point Dryer (CPD)

Critical Point Dryer (CPD)

Leica EM CPD300

Device Description

The critical point drying procedure is an effective method for drying sensitive samples for SEM applications. It is used to protect the surface structure of the sample, which can be damaged due to surface tension when passing from liquid to gas.

  • Temperature control can be made between 5-40oC or -40 to 60ºC.
  • The sample chamber has a volume of 175 ml.
  • The system works completely automatically.
  • Uses CO2 to dry.
  • Critical point drying for use in SEM applications of biological and industrial samples
    operation is possible in this system

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