Scanning Electron Microscope (SEM)
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Scanning Electron microscope
SEM(HITACHI, SU7000 Field Emission SEM)
Device Description
Electron microscopy is used for imaging materials in micro/nano dimensions, determining the elemental and chemical compositions of materials.
- Acceleration voltage 30 kV
- Dot resolution; 0.8 nm (@15kV), 0.9 nm (@1kV)
- Sample table tilt angle -5~70°,
- Detectors: UD (Upper Detector), MD (Middle Detector), LD (Lower Detector), UVD (Ultra Variable Pressure Detector)
- Variable Pressure (VP) Mode
- EDX Detector
- STEM Detector
- Displaying micro/nano structures
- Displaying the structures of biological samples
- STEM Imaging
- Examination of elemental and chemical compositions of materials as points
- EDX mapping
